Multiple design error diagnosis and correction in digital VLSI circuits

被引：0
|
作者：
Veneris, Andreas [1 ]
Venkataraman, Srikanth [1 ]
Hajj, Ibrahim N. [1 ]
Fuchs, W.Kent [1 ]
机构：
[1] Univ of Illinois, Urbana, United States
来源：
Proceedings of the IEEE VLSI Test Symposium | 1999年
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D O I：
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学科分类号：
摘要：
VLSI circuits
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页码：58 / 63
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