Hardness measurements of the thin film

被引：0
|
作者：
Bykov, Yu.A. [1 ]
Karpukhin, S.D. [1 ]
Panfilov, Yu.V. [1 ]
Bojchenko, M.K. [1 ]
Cheptsov, V.O. [1 ]
Osipov, A.V. [1 ]
机构：
[1] MGTU im. N.E. Baumana, Moscow, Russia
来源：
Metallovedenie i Termicheskaya Obrabotka Metallov | 2003年 / 10期
关键词：
422.2 Test Methods - 541.1 Aluminum - 731.1 Control Systems - 804.2 Inorganic Compounds - 813.2 Coating Materials - 921 Mathematics;
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摘要：
(Edited Abstract)
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页码：32 / 35
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