Hardness measurements of the thin film

被引：0

作者：

Bykov, Yu.A. ^{[1
]}

Karpukhin, S.D. ^{[1
]}

Panfilov, Yu.V. ^{[1
]}

Bojchenko, M.K. ^{[1
]}

Cheptsov, V.O. ^{[1
]}

Osipov, A.V. ^{[1
]}

机构：

[1] MGTU im. N.E. Baumana, Moscow, Russia

来源：

Metallovedenie i Termicheskaya Obrabotka Metallov | 2003年 / 10期

关键词：

422.2 Test Methods - 541.1 Aluminum - 731.1 Control Systems - 804.2 Inorganic Compounds - 813.2 Coating Materials - 921 Mathematics;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

(Edited Abstract)

引用

页码：32 / 35

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