首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
JOSEPHSON INTEGRATED CIRCUIT PROCESS FOR SCIENTIFIC APPLICATIONS.
被引:0
作者
:
Sandstrom, R.L.
论文数:
0
引用数:
0
h-index:
0
机构:
IBM, Yorktown Heights, NY, USA, IBM, Yorktown Heights, NY, USA
IBM, Yorktown Heights, NY, USA, IBM, Yorktown Heights, NY, USA
Sandstrom, R.L.
[
1
]
Kleinsasser, A.W.
论文数:
0
引用数:
0
h-index:
0
机构:
IBM, Yorktown Heights, NY, USA, IBM, Yorktown Heights, NY, USA
IBM, Yorktown Heights, NY, USA, IBM, Yorktown Heights, NY, USA
Kleinsasser, A.W.
[
1
]
Gallagher, W.J.
论文数:
0
引用数:
0
h-index:
0
机构:
IBM, Yorktown Heights, NY, USA, IBM, Yorktown Heights, NY, USA
IBM, Yorktown Heights, NY, USA, IBM, Yorktown Heights, NY, USA
Gallagher, W.J.
[
1
]
Raider, S.I.
论文数:
0
引用数:
0
h-index:
0
机构:
IBM, Yorktown Heights, NY, USA, IBM, Yorktown Heights, NY, USA
IBM, Yorktown Heights, NY, USA, IBM, Yorktown Heights, NY, USA
Raider, S.I.
[
1
]
机构
:
[1]
IBM, Yorktown Heights, NY, USA, IBM, Yorktown Heights, NY, USA
来源
:
IEEE Transactions on Magnetics
|
1986年
/ MAG-23卷
/ 02期
关键词
:
D O I
:
暂无
中图分类号
:
学科分类号
:
摘要
:
25
引用
收藏
相关论文
未找到相关数据
未找到相关数据