Parameters Influencing Peak Localization Repeatability for X-ray Measurements-Use of Experiment Designs Technique

被引：0

作者：

François, M. ^{[1
]}

Bourniquel, B. ^{[1
]}

Not, C. ^{[2
]}

Guillen, R. ^{[1
]}

Duval, C. ^{[2
]}

机构：

[1] Laboratoire d'Applications des Matériaux À la Mécanique (LAMM), IUT de Saint-Nazaire, Saint-Nazaire, France

[2] Aérospatiale, Centre Commun de Recherche Louis Blériot, Suresnes, France

来源：

International Journal of Materials Research | 2000年 / 91卷 / 05期

关键词：

D O I：

10.1515/ijmr-2000-910513

中图分类号：

学科分类号：

摘要：

The repeatability of peak position as a function of counting statistics has been studied for four localization methods: The parabola, the middle of chord, the centred centroid and the cross-correlation. Computer simulations of the diffraction peaks were performed to analyse, through an experiment design, the influence of six parameters: The peak to background ratio, the background slope, the peak breadth, shape and position and the acquisition range. The centred centroid gives a better repeatability than the other methods. Our results are also compared with the literature. © 2000 Carl Hanser Verlag. All rights reserved.

引用

页码：414 / 420

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