Parameters Influencing Peak Localization Repeatability for X-ray Measurements-Use of Experiment Designs Technique

被引：0
|
作者：
François, M. [1 ]
Bourniquel, B. [1 ]
Not, C. [2 ]
Guillen, R. [1 ]
Duval, C. [2 ]
机构：
[1] Laboratoire d'Applications des Matériaux À la Mécanique (LAMM), IUT de Saint-Nazaire, Saint-Nazaire, France
[2] Aérospatiale, Centre Commun de Recherche Louis Blériot, Suresnes, France
来源：
International Journal of Materials Research | 2000年 / 91卷 / 05期
关键词：
D O I：
10.1515/ijmr-2000-910513
中图分类号：
学科分类号：
摘要：
The repeatability of peak position as a function of counting statistics has been studied for four localization methods: The parabola, the middle of chord, the centred centroid and the cross-correlation. Computer simulations of the diffraction peaks were performed to analyse, through an experiment design, the influence of six parameters: The peak to background ratio, the background slope, the peak breadth, shape and position and the acquisition range. The centred centroid gives a better repeatability than the other methods. Our results are also compared with the literature. © 2000 Carl Hanser Verlag. All rights reserved.
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页码：414 / 420
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