共 10 条
- [1] INFLUENCE OF UNIAXIAL DEFORMATION ON THE RECOMBINATION OF NONEQUILIBRIUM CARRIERS IN SILICON IRRADIATED WITH gamma RAYS. Soviet physics. Semiconductors, 1981, 15 (01): : 58 - 60
- [3] DETERMINATION OF THE NONEQUILIBRIUM CARRIER LIFETIME IN STRONGLY EXCITED CdSxSe1 - x. Soviet physics. Semiconductors, 1979, 13 (07): : 789 - 791
- [4] Minority carrier lifetime in Czochralski silicon containing oxide precipitates ECS Transactions, 1938, 11 (121-132):
- [5] INFLUENCE OF GROWTH DEFECTS ON THE ELECTRICAL PROPERTIES OF RADIATION-DOPED SILICON. 1978, 12 (10): : 1118 - 1120
- [7] INFLUENCE OF THE CHARGE STATE OF PRIMARY DEFECTS ON THE FORMATION OF COMPLEXES IN n-TYPE SILICON. Soviet physics. Semiconductors, 1980, 14 (02): : 189 - 191
- [8] INFLUENCE OF THE IRRADIATION TEMPERATURE AND OF THE NATURE OF DOPANT ON THE FORMATION OF DEFECTS IN N-TYPE ELECTRON-IRRADIATED SILICON. Soviet Physics, Semiconductors (English translation of Fizika i Tekhnika Poluprovodnikov), 1974, 8 (03): : 303 - 305
- [9] INFLUENCE OF UNIAXIAL COMPRESSION ON THE IMPURITY-BAND CONDUCTION IN p-TYPE InSb. 1973, 7 (02): : 287 - 288