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  • [31] Mobile Augmented Reality for Japanese Vocabulary and Hiragana Letters Learning with Mnemonic Method
    Safitri, Riri
    Muslima, Resnia Trya
    Herlina, Sandra
    2022 7th International Conference on Informatics and Computing, ICIC 2022, 2022,
  • [32] IEEE Computer Architecture Letters: Editorial: Letter from the Editor-in-Chief
    Skadron, Kevin
    IEEE Computer Architecture Letters, 2010, 9 (02) : 37 - 44
  • [33] Announcing the Winner of the Inaugural Nano Letters Seed Grant Program, Europe and Australia Region
    Lu, Nanshu
    Nam, Jwa-Min
    NANO LETTERS, 2022, 22 (20) : 8035 - 8036
  • [34] Letter Vol. 47, No. 2 / 15 January 2022 / Optics Letters
    Sweeney D.C.
    Petrie C.M.
    Optics Letters, 2022, 47 (02) : 269 - 272
  • [35] Announcing the Winner of the Inaugural Nano Letters Seed Grant Program, East Asia Region
    Besley, Elena
    Nuckolls, Colin
    NANO LETTERS, 2022, 22 (16) : 6463 - 6464
  • [36] Subretinal microelectrode arrays allow blind retinitis pigmentosa patients to recognize letters and combine them to words
    Centre for Ophthalmology, University of Tuebingen, Tuebingen, Germany
    不详
    不详
    不详
    不详
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    Proc. Int. Conf. Biomed. Eng. Informatics, BMEI, 1600,
  • [37] Comprehensive Analysis of Warning Letters Issued by FDA to Chinese and Indian Pharmaceutical Enterprises: from 2016 to 2020
    Chen, Zhaozeng
    Xia, Yifan
    Li, Hui
    Chinese Journal of Pharmaceuticals, 2023, 54 (09) : 1391 - 1395
  • [38] COVID-19 and Beyond: Our Selections for the Best ES&T Letters Papers in 2020
    Brooks, Bryan W.
    Arnold, William A.
    Boehm, Alexandria B.
    Martin, Jonathan W.
    Mihelcic, James R.
    Schlenk, Daniel
    Wang, Shuxiao
    ENVIRONMENTAL SCIENCE & TECHNOLOGY LETTERS, 2021, 8 (08) : 604 - 605
  • [39] Comments on noise source modeling for cyclostationary noise analysis in large-signal device operation (multiple letters)
    Delage, S.L.
    Obregon, J.
    Bonani, F.
    Donati Guerrieri, S.
    Ghione, G.
    IEEE Trans. Electron Devices, 1600, 10 (2183-2184):
  • [40] Erratum: Hard x-ray photoemission study on strain effect in LaNiO3thin films (Applied Physics Letters (2021) 118 (161601) DOI: 10.1063/5.0044047)
    Yamagami, K.
    Ikeda, K.
    Hariki, A.
    Zhang, Y.
    Yasui, A.
    Takagi, Y.
    Hotta, Y.
    Katase, T.
    Kamiya, T.
    Wadati, H.
    Applied Physics Letters, 2021, 118 (23)
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