共 50 条
- [1] OBSERVATION OF ATOMIC DEFECTS ON LIF(100) SURFACE WITH ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE (UHV AFM) JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1993, 32 (6B): : 2980 - 2982
- [2] ATOMIC-RESOLUTION IMAGING OF ZNSSE(110) SURFACE WITH ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE (UHV-AFM) JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1995, 34 (4A): : L462 - L464
- [3] Observation of GaAs(110) surface by an ultrahigh-vacuum atomic force microscope Sugawara, Yasuhiro, 1600, JJAP, Minato-ku, Japan (33):
- [4] OBSERVATION OF GAAS(110) SURFACE BY AN ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1994, 33 (6B): : 3739 - 3742
- [5] Observation of silicon surfaces using ultrahigh vacuum noncontact atomic force microscope JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1998, 37 (6B): : 3765 - 3768
- [6] Observation of silicon surfaces using ultrahigh vacuum noncontact atomic force microscope Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 1998, 37 (6 B): : 3765 - 3768
- [9] ATOMIC RESOLUTION ON THE SURFACE OF LIF(100) BY ATOMIC FORCE MICROSCOPY JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 1329 - 1332
- [10] Atomic resolution imaging of InP(110) surface observed with ultrahigh vacuum atomic force microscope in noncontact mode JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02): : 953 - 956