共 33 条
- [1] Algorithms to select I-DDQ measurement points to detect bridging faults JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1996, 8 (03): : 275 - 285
- [2] Algorithms to select IDDQ measurement vectors for bridging faults in sequential circuits JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2000, 16 (05): : 443 - 451
- [3] Algorithms to Select IDDQ Measurement Vectors for Bridging Faults in Sequential Circuits Journal of Electronic Testing, 2000, 16 : 443 - 451
- [5] Sequential circuit test generation for IDDQ testing of bridging faults IEEE INTERNATIONAL WORKSHOP ON IDDQ TESTING, DIGEST OF PAPERS, 1997, : 12 - 16
- [6] Observation time reduction for IDDQ testing of bridging faults in sequential circuits SEVENTH ASIAN TEST SYMPOSIUM (ATS'98), PROCEEDINGS, 1998, : 312 - 317
- [7] Detection of bridging faults in logic resources of configurable FPGAs using IDDQ INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS, 1998, : 1037 - 1046
- [8] Memory reduction of IDDQ test compaction for internal and external bridging faults PROCEEDINGS OF THE NINTH ASIAN TEST SYMPOSIUM (ATS 2000), 2000, : 350 - 355
- [9] A simple and efficient method for generating compact IDDQ test set for bridging faults 16TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1998, : 112 - 117