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TEST & MEASUREMENT.
被引：0
|作者：
Comerford, Richard W.
机构：
来源：
Electronics
|
1981年
/
54卷
/
21期
关键词：
ELECTRIC MEASUREMENTS - Computer Applications - INTEGRATED CIRCUITS - Very Large Scale Integration - LOGIC DEVICES - Analysis;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The functional integration and automation are presented as the key to more capable testing instruments for the more complex VLSI circuitry. Logic analyzers and various testers used in design and field service are introduced. All these instruments are aided by microprocessors. The strong emphasis on logic analyzers underscores digital design as motivating force in the industry: VLSI presents the possibility of designing entire instruments on a single chip, provided the design is largely digital.
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页码：164 / 168
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