Depth-dose profiles in polymethyl methacrylate and in aluminium irradiated by 8-MeV electrons

被引：6

作者：

Janovsky, I. ^{[1
]}

Miller, A. ^{[1
]}

机构：

[1] Nuclear Research Institute, 250 68 Rez, Czechoslovakia

来源：

International journal of radiation applications and instrumentation. Part A, Applied radiation and isotopes | 1986年 / 37卷 / 12期

关键词：

ELECTRONS;

D O I：

10.1016/0883-2889(86)90018-3

中图分类号：

学科分类号：

摘要：

Depth-dose profiles were measured by thin-film dosimetry in electrically isolating and conducting media (polymethyl methacrylate and aluminium) irradiated with 8-MeV electrons under radiation processing conditions in air. Almost identical profiles were found, both in solids and in stacked layers of these materials, when depth is represented in units of g multiplied by (times) cm** minus **2.

引用

页码：1251 / 1252