Microstructures of Co/Cr bilayer films epitaxially grown on MgO single-crystal substrates

被引：0

作者：

Hitachi, Ltd, Tokyo, Japan ^{[1
]}

机构：

来源：

Jpn J Appl Phys Part 1 Regul Pap Short Note Rev Pap | / 5 A卷 / 2307-2311期

关键词：

804.2 Inorganic Compounds - 931.2 Physical Properties of Gases; Liquids and Solids - 933.1 Crystalline Solids and Crystallography - 933.1.1 Crystal Lattice - 933.1.2 Crystal Growth;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Microstructures of Co/Cr bilayer films epitaxially grown on MgO (100) and (110) single-crystal substrates have been studied by high-resolution transmission electron microscopy. The bicrystalline Co layer formed on the MgO (100) substrate contains a number of (0001) stacking faults. The single-crystal Co layer formed on the MgO (110) substrate consists of slightly misoriented subgrains, grown on (211)-oriented Cr domains. Dislocations and lattice strain are observed at the Cr/MgO (110) interface. The misorientations and the defects are thought to be introduced to accommodate the large lattice mismatch of about -16% in the MgO [1¯10] direction at the Cr/MgO (110) interface.

引用