Microstructures of Co/Cr bilayer films epitaxially grown on MgO single-crystal substrates

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Hitachi, Ltd, Tokyo, Japan [1 ]
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Jpn J Appl Phys Part 1 Regul Pap Short Note Rev Pap | / 5 A卷 / 2307-2311期
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804.2 Inorganic Compounds - 931.2 Physical Properties of Gases; Liquids and Solids - 933.1 Crystalline Solids and Crystallography - 933.1.1 Crystal Lattice - 933.1.2 Crystal Growth;
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Microstructures of Co/Cr bilayer films epitaxially grown on MgO (100) and (110) single-crystal substrates have been studied by high-resolution transmission electron microscopy. The bicrystalline Co layer formed on the MgO (100) substrate contains a number of (0001) stacking faults. The single-crystal Co layer formed on the MgO (110) substrate consists of slightly misoriented subgrains, grown on (211)-oriented Cr domains. Dislocations and lattice strain are observed at the Cr/MgO (110) interface. The misorientations and the defects are thought to be introduced to accommodate the large lattice mismatch of about -16% in the MgO [1¯10] direction at the Cr/MgO (110) interface.
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