共 50 条
- [31] Nondestructive diagnostics of microchannel (Macroporous) silicon by X-ray topography Technical Physics Letters, 2000, 26 : 1087 - 1090
- [32] Real structure of a microchannel silicon studied by X-ray diffraction Technical Physics Letters, 2001, 27 : 41 - 44
- [33] Evaluation method of precipitated oxygen concentration in low resistivity silicon wafers using X-ray diffraction ICDS-18 - PROCEEDINGS OF THE 18TH INTERNATIONAL CONFERENCE ON DEFECTS IN SEMICONDUCTORS, PTS 1-4, 1995, 196-2 : 1865 - 1869
- [37] Core electron deformation in silicon from powder X-ray diffraction ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2017, 73 : C572 - C572
- [38] X-ray spectroscopic study of electronic structure of amorphous silicon and silicyne Semiconductors, 2001, 35 : 956 - 961
- [40] Fabrication of high resolution and lightweight monocrystalline silicon X-ray mirrors OPTICS FOR EUV, X-RAY, AND GAMMA-RAY ASTRONOMY VII, 2015, 9603