CRYSTAL SPECTROGRAPH FOR A SOFT X-RAY MEASUREMENT IN IMPLODING PLASMA EXPERIMENTS.

被引：0
|
作者：
Shimoda, Katsuji [1 ]
Yamamoto, Toshikazu [1 ]
Takada, Satoshi [1 ]
Sone, Hisao [1 ]
Hirano, Katsumi [1 ]
机构：
[1] Gunma Univ, Kiryu, Jpn, Gunma Univ, Kiryu, Jpn
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes | 1987年 / 26卷 / 03期
关键词：
SPECTROSCOPY; X-RAY - Applications - X-RAY AND GAMMA RAY PRODUCTION - Measurements;
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摘要：
To measure the wavelength of a soft X-ray locally fluctuating plasma, a compact, crystal spectrograph was constructed. The spectrograph was designed so as to record lines and a pinhole picture on a photographic film for a precise measurement of the wavelength. In order to obtain a high dispersion, a flat crystal with an RAP (double atomic spacing; 26. 12 A) was installed. Using the spectrograph, ArXVII and ArXVI lines generated by plasma focus were observed using both time-resolved and time-integrated techniques with sufficient dispersion and resolving power.
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页码：451 / 454
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