CRYSTAL SPECTROGRAPH FOR A SOFT X-RAY MEASUREMENT IN IMPLODING PLASMA EXPERIMENTS.

被引：0

作者：

Shimoda, Katsuji ^{[1
]}

Yamamoto, Toshikazu ^{[1
]}

Takada, Satoshi ^{[1
]}

Sone, Hisao ^{[1
]}

Hirano, Katsumi ^{[1
]}

机构：

[1] Gunma Univ, Kiryu, Jpn, Gunma Univ, Kiryu, Jpn

来源：

Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes | 1987年 / 26卷 / 03期

关键词：

SPECTROSCOPY; X-RAY - Applications - X-RAY AND GAMMA RAY PRODUCTION - Measurements;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

To measure the wavelength of a soft X-ray locally fluctuating plasma, a compact, crystal spectrograph was constructed. The spectrograph was designed so as to record lines and a pinhole picture on a photographic film for a precise measurement of the wavelength. In order to obtain a high dispersion, a flat crystal with an RAP (double atomic spacing; 26. 12 A) was installed. Using the spectrograph, ArXVII and ArXVI lines generated by plasma focus were observed using both time-resolved and time-integrated techniques with sufficient dispersion and resolving power.

引用

页码：451 / 454

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