共 18 条
- [1] Characterization of polyacrylonitrile films grafted onto nickel by ellipsometry, atomic force microscopy and X-ray reflectivity Thin Solid Films, 1-2 (148-155):
- [2] Study of the interface roughness using polarized neutron and X-ray reflectivity on MBE permalloy thin films J Phys Chem Solids, 8 (1491-1494):
- [3] Surface effects in displacive phase transformations studied by X-ray specular reflectivity Physica B: Condensed Matter, 1998, 248 : 83 - 89
- [4] Surfactant influence on the Ge heteroepilayer on Si(0 0 1) studied by X-ray diffraction and atomic force microscopy J Cryst Growth, 1-2 ([d]115-119):
- [5] Grazing incidence X-ray reflectivity: A new experimental approach to the martensitic surface relief Mater Sci Eng A Struct Mater Prop Microstruct Process, (291-295):
- [6] Atomic force microscopy and x-ray photoelectron spectroscopy investigations of the morphology and chemistry of a PdCl2/SnCl2 electroless plating catalysis system adsorbed onto shape memory alloy particles Silvain, J.F. (silvain@icmb-bordeaux.cnrs.fr), 1600, American Institute of Physics Inc. (96):
- [8] High-resolution synchrotron X-ray scattering study of the surface and interface structures of YBa2Cu3Ox thin films Phys B Condens Matter, (56-61):
- [9] Depth-dependent investigation of the distribution of the spin density waves in thin chromium films with surface X-ray and neutron scattering Phys B Condens Matter, (115-120):
- [10] X-ray and magnetic study of epitaxial W/Gd/W and W/Tb/W thin films Journal of Alloys and Compounds, 1999, 286 : 333 - 336