共 50 条
- [1] Surface and interface morphology of thin oxide films investigated by X-ray reflectivity and atomic force microscopy SURFACE & COATINGS TECHNOLOGY, 1998, 100 (1-3): : 76 - 79
- [2] Characterization of thin films for X-ray and neutron waveguiding by X-ray reflectivity and atomic force microscopy PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2013, 210 (11): : 2416 - 2422
- [4] A comparison between the atomic force microscopy and x-ray reflectivity on the characterization of surface roughness International Journal of Nanoscience, Vol 2, Nos 4 and 5, 2003, 2 (4-5): : 343 - 348
- [6] A comparison between the atomic force microscopy and X-ray reflectivity on the characterization of the roughness of a surface TESTING, RELIABILITY, AND APPLICATION OF MICRO- AND NANO-MATERIAL SYSTEMS II, 2004, 5392 : 123 - 131
- [8] Characterization of zinc oxide thin film using atomic force microscopy and optimized X-ray reflectivity by genetic algorithm Experimental Techniques, 2014, 38 : 21 - 27
- [10] Orthoclase surface structure and dissolution measured in situ by X-ray reflectivity and atomic force microscopy WATER-ROCK INTERACTION, VOLS 1 AND 2, 2001, : 431 - 434