Texture structure analysis and crystalline quality improvement of CeO2(110) layers grown on Si(100) substrates

被引：0

作者：

Inoue, Tomoyasu ^{[1
]}

Ohsuna, Tetsu ^{[1
]}

Yamada, Yoshinori ^{[1
]}

Wakamatsu, Kiyoshi ^{[1
]}

Itoh, Youichi ^{[1
]}

Nozawa, Takayuki ^{[1
]}

Sasaki, Eiji ^{[1
]}

Yamamoto, Yasuhiro ^{[1
]}

Sakurai, Yoshinobu ^{[1
]}

机构：

[1] Iwaki Meisel Univ, Iwaki, Japan

来源：

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1992年 / 31卷 / 12 B期

关键词：

D O I：

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中图分类号：

学科分类号：

摘要：

引用

页码：1736 / 1739

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