Texture structure analysis and crystalline quality improvement of CeO2(110) layers grown on Si(100) substrates

被引：0
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作者：
Inoue, Tomoyasu [1 ]
Ohsuna, Tetsu [1 ]
Yamada, Yoshinori [1 ]
Wakamatsu, Kiyoshi [1 ]
Itoh, Youichi [1 ]
Nozawa, Takayuki [1 ]
Sasaki, Eiji [1 ]
Yamamoto, Yasuhiro [1 ]
Sakurai, Yoshinobu [1 ]
机构：
[1] Iwaki Meisel Univ, Iwaki, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1992年 / 31卷 / 12 B期
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页码：1736 / 1739
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