Quantitative depth profile analysis by EPMA combined with Monte-Carlo simulation

被引：0
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作者：
Ammann, Norbert [1 ]
Karduck, Peter [1 ]
机构：
[1] RWTH, Aachen, Germany
来源：
Surface and Interface Analysis | 1994年 / 22卷 / 01期
关键词：
28;
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页码：54 / 59
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