共 50 条
- [22] PROGRAMMABLE CURRENT LOAD FOR TESTING INTEGRATED CIRCUITS. IBM technical disclosure bulletin, 1984, 27 (4 A): : 1940 - 1941
- [23] Modelling RF interference effects in integrated circuits. 2001 IEEE EMC INTERNATIONAL SYMPOSIUM, VOLS 1 AND 2, 2001, : 1203 - 1208
- [25] QUALITATIVE BEHAVIORS OF A CLASS OF MOS DIGITAL CIRCUITS. Transactions of the Institute of Electronics, Information and Communication Engineers, Section E (, 1987, E70 (03): : 165 - 168
- [26] TWO APPROACHES TO THE THEORY OF DIGITAL SIGNALS AND CIRCUITS. Telecommunications and Radio Engineering (English translation of Elektrosvyaz and Radiotekhnika), 1974, 28-29 (11): : 84 - 90
- [28] CONTROLLING NOISE IN HIGH SPEED DIGITAL CIRCUITS. Electronic Packaging and Production, 1981, 21 (04): : 115 - 121
- [29] EASILY TESTABLE DESIGN OF LARGE DIGITAL CIRCUITS. NEC Research and Development, 1979, (54): : 49 - 55
- [30] LOGIC GENERATOR IGA FOR MEASURING DIGITAL CIRCUITS. News from Rohde & Schwarz, 1981, 21 (95): : 4 - 7