Nanoscale patterning of an organosilane monolayer on the basis of tip-induced electrochemistry in atomic force microscopy

被引：0
|
作者：
Sugimura, Hiroyuki
Okiguchi, Keiko
Nakagiri, Nobuyuki
Miyashita, Masayuki
机构：
来源：
Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena | 1996年 / 14卷 / 06期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] Nanoscale patterning of an organosilane monolayer on the basis of tip-induced electrochemistry in atomic force microscopy
    Sugimura, H
    Okiguchi, K
    Nakagiri, N
    Miyashita, M
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (06): : 4140 - 4143
  • [2] TIP-INDUCED MODIFICATIONS IN SCANNING-TUNNELING-MICROSCOPY AND ATOMIC-FORCE MICROSCOPY
    CHO, K
    JOANNOPOULOS, JD
    SCANNING MICROSCOPY, 1995, 9 (02) : 381 - 386
  • [3] Spatial Manipulation and Assembly of Nanoparticles by Atomic Force Microscopy Tip-Induced Dielectrophoresis
    Zhou, Peilin
    Yu, Haibo
    Yang, Wenguang
    Wen, Yangdong
    Wang, Zhidong
    Li, Wen Jung
    Liu, Lianqing
    ACS APPLIED MATERIALS & INTERFACES, 2017, 9 (19) : 16715 - 16724
  • [4] Tip-induced deformation of polystyrene latex reference nanoparticles in atomic force microscopy
    Farkas, Natalia
    Kramar, John A.
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2020, 38 (02):
  • [5] Tip-induced artifacts in magnetic force microscopy images
    Iglesias-Freire, Oscar
    Bates, Jeffrey R.
    Miyahara, Yoichi
    Asenjo, Agustina
    Gruetter, Peter H.
    APPLIED PHYSICS LETTERS, 2013, 102 (02)
  • [6] Tip-Induced Micropatterning of Silk Fibroin Protein Using In Situ Solution Atomic Force Microscopy
    Zhong, Jian
    Ma, Mengjia
    Zhou, Juan
    Wei, Daixu
    Yan, Zhigiang
    He, Dannong
    ACS APPLIED MATERIALS & INTERFACES, 2013, 5 (03) : 737 - 746
  • [7] Nanoscale materials patterning and engineering by atomic force microscopy nanolithography
    Xie, X. N.
    Chung, H. J.
    Sow, C. H.
    Wee, A. T. S.
    MATERIALS SCIENCE & ENGINEERING R-REPORTS, 2006, 54 (1-2): : 1 - 48
  • [8] Non-contact atomic force microscopy observation on GaAs(110) surface with tip-induced relaxation
    Uehara, N
    Hosoi, H
    Sueoka, K
    Mukasa, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2004, 43 (7B): : 4676 - 4678
  • [9] Fabrication of nanoparticle pattern through atomic force microscopy tip-induced deposition on modified silicon surfaces
    Liao, JH
    Huang, L
    Gu, N
    CHINESE PHYSICS LETTERS, 2002, 19 (01): : 134 - 136
  • [10] Magneto-thermoelectric effects mapping using tip-induced temperature gradient in atomic force microscopy
    Isshiki, Hironari
    Budai, Nico
    Otani, YoshiChika
    FRONTIERS IN PHYSICS, 2023, 11
12345