CRYSTALLOGRAPHY OF PtSi FILMS ON (001) SILICON.

被引：0
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作者：
Ben Ghozlene, Hedi
Beaufrere, Pierre
Authier, Andre
机构：
[1] Compagnie IBM France, 91102 - Corbeil - Essonnes, France
[2] Laboratoire de Cristallographie-Minéralogie Associé au CNRS, Université de Paris VI, France
来源：
Journal of Applied Physics | 1978年 / 49卷 / 07期
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页码：3998 / 4004
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