Effect of impurities on X-ray Compton scattering in belite

被引：0

作者：

Purlys, R.P. ^{[1
]}

Stasiunas, S.E. ^{[1
]}

Yakimavichius, J.A. ^{[1
]}

机构：

[1] Vilnius Univ, Vilnius, Lithuania

来源：

Materials Science Forum | 1996年 / 228-231卷 / pt 1期

关键词：

Chemical bonds - Crystal impurities - Crystal lattices - Doping (additives) - Electromagnetic wave attenuation - Electromagnetic wave scattering - Polycrystalline materials - Silicate minerals;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

X ray Compton scattering is a potential procedure for investigating crystal defects. Its application to a belite sample doped with 1% K or Co revealed the considerable effects of slight impurities on the fine structure of Compton scattering profiles, which were otherwise undetected by conventional methods. Impurities generate interatomic bonds attenuation which, in turn, generate additional intense and narrower lines on the fine structure, different for every impurity.

引用

页码：439 / 441