Nanoanalytical investigations of functional materials by transmission electron microscopy

被引：0

作者：

Wetzig, Klaus ^{[1
]}

Thomas, Jürgen ^{[1
]}

机构：

[1] Institut für Festkörper-Und Werkstoffforschung Dresden, PF 27 01 16, Dresden,D-01171, Germany

来源：

| 2001年 / Walter de Gruyter GmbH卷 / 38期

关键词：

Aluminum alloys - Chemical bonds - Film preparation - Silicides - Iron alloys - Multilayers - Binary alloys;

D O I：

10.1515/pm-2001-381105

中图分类号：

学科分类号：

摘要：

The paper starts with a short survey of the methodical state of the art in analytical TEM. This contains the interaction of the primary electron beam with sample atoms, the arrangement of analytical components and possible analytical information in the analytical TEM. Then the efficiency of the analytical techniques electron nanodiffraction, EDXS and EELS is discussed for actual problems of functional materials. The nanostructure of silicide thin films, nanoanalytical investigations of GMR multilayers and chemical bonding of oxygen in nanoscale Fe-Al multilayer cross sections belong to this. © 2001 Carl Hanser Verlag. All rights reserved.

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