Characterization of protein and virus crystals by quasi-planar wave X-ray topography: A comparison between crystals grown in solution and in agarose gel

被引：0
|
作者：
Inst. Biol. Molec. et Cell. du CNRS, UPR 9002, 15 R. Rene Descartes, F., Strasbourg Cedex, France [1 ]
不详 [2 ]
不详 [3 ]
机构：
来源：
J Cryst Growth | / 3卷 / 357-368期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [21] X-RAY TOPOGRAPHIC ASSESSMENT OF DISLOCATIONS IN CRYSTALS GROWN FROM SOLUTION
    BHAT, HL
    PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 1985, 11 (02) : 57 - 87
  • [22] Partial dislocations in the X-ray topography of as-grown hexagonal silicon carbide crystals
    Vetter, WM
    Dudley, M
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2001, 87 (02): : 173 - 177
  • [23] Characterization of defects in silicon carbide single crystals by synchrotron X-ray topography
    Wang, SP
    Dudley, M
    Huang, W
    Carter, CH
    Tsvetkov, VF
    Fazi, C
    SEMICONDUCTOR CHARACTERIZATION: PRESENT STATUS AND FUTURE NEEDS, 1996, : 278 - 282
  • [24] CHARACTERIZATION OF LINBO3 SINGLE-CRYSTALS BY X-RAY TOPOGRAPHY
    SUGII, K
    MIYAZAWA, S
    KONDO, S
    IWASAKI, H
    FUSHIMI, S
    REVIEW OF THE ELECTRICAL COMMUNICATIONS LABORATORIES, 1975, 23 (5-6): : 569 - 580
  • [25] Digital topography with an X-ray CCD camera for characterizing perfection in protein crystals
    Wako, Kei
    Kimura, Kunio
    Yamamoto, Yu
    Sawaura, Takuya
    Shen, Mengyuan
    Tachibana, Masaru
    Kojima, Kenichi
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2012, 45 : 1009 - 1014
  • [26] CHARACTERIZATION OF LiNbO3 SINGLE CRYSTALS BY X-RAY TOPOGRAPHY.
    Sugii, Kiyomasa
    Miyazawa, Shintaro
    Kondo, Susumu
    Iwasaki, Hiroshi
    Fushimi, Shoichi
    Review of the Electrical Communication Laboratories (Tokyo), 1975, 23 (5-6): : 569 - 580
  • [27] Radiation-induced defects in protein crystals observed by X-ray topography
    Suzuki, Ryo
    Baba, Seiki
    Mizuno, Nobuhiro
    Hasegawa, Kazuya
    Koizumi, Haruhiko
    Kojima, Kenichi
    Kumasaka, Takashi
    Tachibana, Masaru
    ACTA CRYSTALLOGRAPHICA SECTION D-STRUCTURAL BIOLOGY, 2022, 78 : 196 - 203
  • [28] QUANTITATIVE ANALYSIS OF WEAK DEFORMATION FIELDS IN CRYSTALS BY X-RAY PLANE WAVE TOPOGRAPHY
    Voloshin, A. E.
    Smolsky, I. L.
    Sorokin, S. S.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1996, 52 : C369 - C369
  • [29] Characterization of structural defects in MLEK grown InP single crystals using synchrotron white beam X-ray topography
    Chung, H
    Si, W
    Dudley, M
    Anselmo, A
    Bliss, DF
    Maniatty, A
    Zhang, H
    Prasad, V
    JOURNAL OF CRYSTAL GROWTH, 1997, 174 (1-4) : 230 - 237
  • [30] X-ray Lang topography and infrared spectroscopy in quartz crystals grown hydrothermally with intermittent runs
    Guha, AK
    Annamalai, N
    Kar, T
    Sengupta, SP
    CRYSTAL RESEARCH AND TECHNOLOGY, 1997, 32 (02) : 329 - 337
12345