Precise measurement of the deep defects and surface states in a-Si:H films by absolute CPM

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Czech Acad of Sciences, Prague, Czech Republic ^{[1
]}

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J Non Cryst Solids | / pt 1卷 / 304-308期

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This work was partially supported by the grants ASCR A1010528; EC-PECO 3029 and Copernicus 0027;

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