High resolution transmission electron microscopy study on the structure of Ge nanoparticles by using an ultrahigh vacuum-molecular beam epitaxy-transmission electron microscope system

被引：0
|
作者：
Wu, Yuan [1 ]
Takeguchi, Masaki [1 ]
Furuya, Kazuo [1 ]
机构：
[1] Natl. Research Institute for Metals, 3-13 Sakura, Tsukuba, Ibaraki 305-0003, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1999年 / 38卷 / 12 B期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：7241 / 7246
相关论文
共 50 条
  • [1] High resolution transmission electron microscopy study on the structure of Ge nanoparticles by using an ultrahigh vacuum-molecular beam epitaxy-transmission electron microscope system
    Wu, Y
    Takeguchi, M
    Furuya, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (12B): : 7241 - 7246
  • [2] Kinetic and high resolution transmission electron microscopy studies on Ge nanoparticles
    Chiu, HW
    Sutter, E
    Kauzlarich, SM
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2005, 230 : U2249 - U2249
  • [3] Transmission electron microscopy of nanostructures grown by molecular beam epitaxy
    Inst of Electron Technology, Warszawa, Poland
    Electron Technol (Warsaw), 2-3 (253-256):
  • [4] DESIGN AND DEVELOPMENT OF AN ULTRAHIGH-VACUUM HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPE
    KONDO, Y
    OHI, K
    ISHIBASHI, Y
    HIRANO, H
    HARADA, Y
    TAKAYANAGI, K
    TANISHIRO, Y
    KOBAYASHI, K
    YAGI, K
    ULTRAMICROSCOPY, 1991, 35 (02) : 111 - 118
  • [5] A quantitative nanodiffraction system for ultrahigh vacuum scanning transmission electron microscopy
    Hembree, GG
    Koch, C
    Spence, JCH
    MICROSCOPY AND MICROANALYSIS, 2003, 9 (05) : 468 - 474
  • [6] DEVELOPMENT OF AN ULTRAHIGH-VACUUM HIGH-RESOLUTION SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
    HARADA, Y
    TOMITA, T
    KOKUBO, Y
    DAIMON, H
    INO, S
    JOURNAL OF ELECTRON MICROSCOPY, 1993, 42 (05): : 294 - 304
  • [7] Development of a surface conductivity measurement system for ultrahigh vacuum transmission electron microscope
    Minoda, H.
    Hatano, K.
    Yazawa, H.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2009, 80 (11):
  • [8] Raman and transmission electron microscopy study of disordered silicon grown by molecular beam epitaxy
    Tay, L
    Lockwood, DJ
    Baribeau, JM
    Wu, X
    Sproule, GI
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2004, 22 (03): : 943 - 947
  • [9] Investigation of the Structure of Zirconia Nanoparticles by High-Resolution Transmission Electron Microscopy
    V. Ya. Shevchenko
    O. L. Khasanov
    A. E. Madison
    J. Y. Lee
    Glass Physics and Chemistry, 2002, 28 : 322 - 325
  • [10] Investigation of the structure of zirconia nanoparticles by high-resolution transmission electron microscopy
    Shevchenko, VY
    Khasanov, OL
    Madison, AE
    Lee, JY
    GLASS PHYSICS AND CHEMISTRY, 2002, 28 (05) : 322 - 325
12345