Modulation voltage and flux noise in high-Tc grain boundary junction superconducting quantum interference devices

被引：0
|
作者：
Suzuki, Daisuke [1 ]
Kuriki, Shinya [1 ]
Matsuda, Mizushi [1 ]
机构：
[1] Hokkaido Univ, Sapporo, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers | 1995年 / 34卷 / 03期
关键词：
Current voltage characteristics - Electric resistance - Grain boundaries - High temperature superconductors - Josephson junction devices - Modulation - Superconductivity - Thermal noise - Thin films - Voltage measurement - Yttrium compounds;
D O I：
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中图分类号：
学科分类号：
摘要：
We have fabricated YBa2Cu3O7-δ bicrystal grain-boundary-junction superconducting quantum interference devices (SQUIDs) having various inductance values, and studied the characteristics of the flux-modulated voltage. Generally, the modulation voltage of high-Tc SQUIDs is lower than the value expected from the IcRn product and the inductance. From the comparison of experimental and theoretical values, it has been found that thermal noise rounding of the I-V characteristic plays a major role in reducing the modulation voltage in the range of the noise parameter of γ = IcΦ0/πkBT 20. We have also studied the relationship between the normal resistance and the modulation voltage of the grain-boundary-junction SQUIDs.
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页码：1510 / 1514
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