FURTHER COMMENT ON 'DETERMINING SPECIFIC CONTACT RESISTIVITY FROM CONTACT END RESISTANCE MEASUREMENTS'.

被引：0
作者：
Finetti, M. [1 ]
机构：
[1] CNR, Inst LAMEL, Bologna, Italy, CNR, Inst LAMEL, Bologna, Italy
来源：
Electron device letters | 1985年 / EDL-6卷 / 04期
关键词：
Compendex;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
7
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页码：184 / 185
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