Non-contact microprocessor based digital laser scanning micrometer

被引：0
|
作者：
Chaudhary, K.P. [1 ]
Moitra, Shashi [1 ]
Agarwal, A.N. [1 ]
机构：
[1] Central Scientific Instruments, Organisation (R&D Group), New Delhi, India
来源：
IETE Journal of Research | 1994年 / 40卷 / 04期
关键词：
Diameter measurement - Digital laser scanning micrometer - Dimension measurement - Non-contact microprocessor;
D O I：
10.1080/03772063.1994.11437192
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：163 / 168
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