Aspects of the Reliability of Integrated Circuits.

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作者：
Ruf, Friedrich
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Elektronik Munchen | 1980年 / 29卷 / 23期
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摘要：
Some possibilities are discussed of adapting the types of redundancy known from systems theory to the requirements of integrated-circuit techniques. Extended majority logic and fault-tolerant circuits are emphasized. Different methods for determining the failure rate of integrated circuits are considered, along with the difficulty posed by modern circuit techniques.
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页码：43 / 47
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