PHYSICAL AND CHEMICAL NATURE OF FILMS FORMED ON Si(100) SURFACES SUBJECTED TO C2H4 AT ELEVATED TEMPERATURES.
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Kim, H.J.
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North Carolina State Univ, Raleigh,, NC, USA, North Carolina State Univ, Raleigh, NC, USANorth Carolina State Univ, Raleigh,, NC, USA, North Carolina State Univ, Raleigh, NC, USA
Kim, H.J.
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Davis, R.F.
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North Carolina State Univ, Raleigh,, NC, USA, North Carolina State Univ, Raleigh, NC, USANorth Carolina State Univ, Raleigh,, NC, USA, North Carolina State Univ, Raleigh, NC, USA
Davis, R.F.
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Cox, X.B.
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North Carolina State Univ, Raleigh,, NC, USA, North Carolina State Univ, Raleigh, NC, USANorth Carolina State Univ, Raleigh,, NC, USA, North Carolina State Univ, Raleigh, NC, USA
Cox, X.B.
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Linton, R.W.
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North Carolina State Univ, Raleigh,, NC, USA, North Carolina State Univ, Raleigh, NC, USANorth Carolina State Univ, Raleigh,, NC, USA, North Carolina State Univ, Raleigh, NC, USA
Linton, R.W.
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机构:
[1] North Carolina State Univ, Raleigh,, NC, USA, North Carolina State Univ, Raleigh, NC, USA
The heteroepitaxial growth of contiguous monocrystalline beta -SiC films is facilitated by the initial and separate chemical conversion of the Si(100) surface via reaction at elevated temperatures with a hydrocarbon gas entrained in H//2. The initial and subsequent reactions produce a very thin film of beta -SiC. Sealing of the initial growth defects and continued pyrolysis of the hydrocarbon combine to both limit the thickness of this film and result in the formation of free C on the final SiC surface. Reflection (high energy) electron diffraction and optical, scanning, and cross-sectional transmission electron microscopies revealed the beta -SiC films to be generally monocrystalline but containing regions of disorder as well as pyramidal-shaped pits, mismatch dislocations, stacking faults, and residual strain.