METHOD OF DETECTING THE NATURE OF IC DEFECTS.

被引：0

作者：

Patyra, M.J. ^{[1
]}

Zabrodzki, J. ^{[1
]}

机构：

[1] Warsaw Technical Univ, Warsaw, Pol, Warsaw Technical Univ, Warsaw, Pol

来源：

Microelectronics Journal | 1988年 / 19卷 / 03期

关键词：

INTEGRATED CIRCUIT TESTING - Defects - Reliability;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Chip features can be caused by point or parametric defects. The method shown is for classifying the failed chips against the two mentioned defects. The concept of an acceptibility region (Schmoo-plots) is used.

引用

页码：41 / 45