SYNCHROTRON X-RAY FLUORESCENCE AND EXTENDED X-RAY ABSORPTION FINE STRUCTURE ANALYSIS.

被引：0
|
作者：
Chen, J.R. [1 ]
Gordon, B.M. [1 ]
Hanson, A.L. [1 ]
Jones, K.W. [1 ]
Kraner, H.W. [1 ]
Chao, E.C.T. [1 ]
Minkin, J.A. [1 ]
机构：
[1] State Univ of New York at Geneseo,, Geneseo, NY, USA, State Univ of New York at Geneseo, Geneseo, NY, USA
来源：
Scanning Electron Microscopy | 1984年 / pt 4期
关键词：
FLUORESCENCE - TRACE ANALYSIS;
D O I：
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摘要：
This paper presents a general introduction to what synchrotron radiation is and the properties that make it valuable. Attention is focused on the x-ray region of the synchrotron radiation spectrum, which is less developed than the vacuum ultraviolet region, where extensive research and reviews already exist. As examples of the application of x-ray synchrotron radiation several noteworthy experiments are considered using synchrotron x-ray fluorescence (SXRF) and extended x-ray absorption fine structure (EXAFS) analyses. In conclusion, the capabilities of the new x-ray microprobes for elemental analysis are discussed with an emphasis on some of the future uses of synchrotron radiation.
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页码：1483 / 1500
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