Field ion microscopy observation of intrinsic stacking faults in iridium

被引：0

作者：

Song, S.G. ^{[1
]}

Chen, C.L. ^{[1
]}

Tsong, T.T. ^{[1
]}

机构：

[1] Los Alamos Natl Lab, Los Alamos, United States

来源：

Materials Science and Engineering A | 1996年 / A212卷 / 01期

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D O I：

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学科分类号：

摘要：

引用

页码：119 / 122

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