Field ion microscopy observation of intrinsic stacking faults in iridium

被引：0
|
作者：
Song, S.G. [1 ]
Chen, C.L. [1 ]
Tsong, T.T. [1 ]
机构：
[1] Los Alamos Natl Lab, Los Alamos, United States
来源：
Materials Science and Engineering A | 1996年 / A212卷 / 01期
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摘要：
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页码：119 / 122
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