RADIATION DAMAGE IN SILICON MICROSTRIP DETECTORS.

被引：0

作者：

Ohsugi, T. ^{[1
]}

Taketani, A. ^{[1
]}

Noda, M. ^{[1
]}

Chiba, Y. ^{[1
]}

Asai, M. ^{[1
]}

Kondo, T. ^{[1
]}

Sato, T. ^{[1
]}

Takasaki, M. ^{[1
]}

Tanaka, K.H. ^{[1
]}

Kondo, K. ^{[1
]}

Hirayama, H. ^{[1
]}

Yamamoto, K. ^{[1
]}

Tanaka, H. ^{[1
]}

机构：

[1] Hiroshima Univ, Hiroshima, Jpn, Hiroshima Univ, Hiroshima, Jpn

来源：

| 1600年 / A265期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

PARTICLE DETECTORS

引用

页码：1 / 2

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