X-RAY TOPOGRAPHIC INVESTIGATION OF STRUCTURAL CHANGES IN SILICON SINGLE CRYSTALS UNDER THE ACTION OF A LASER BEAM.

被引：0

|

作者：

Kostyukova, E.P.

Mirkin, L.I.

Nishchev, K.N.

机构：

来源：

Soviet Physics, Solid State (English translation of Fizika Tverdogo Tela) | 1975年 / 17卷 / 09期

关键词：

Compendex;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

SILICON AND ALLOYS

引用

收藏

页码：1752 / 1754

相关论文

共 50 条

[1] X-RAY TOPOGRAPHIC STUDY OF STRUCTURE CHANGES IN SILICON SINGLE-CRYSTALS UNDER ACTION OF LASER-BEAM
KOSTYUKOVA, EP
MIRKIN, LI
NISHCHEV, KN
FIZIKA TVERDOGO TELA, 1975, 17 (09): : 2635 - 2639
[2] AN X-RAY TOPOGRAPHIC INVESTIGATION OF THE STRUCTURAL PERFECTION OF CDTE SINGLE-CRYSTALS
SKOROKHOD, MY
RARENKO, IM
DATSENKO, LI
INORGANIC MATERIALS, 1985, 21 (11) : 1636 - 1639
[3] INVESTIGATION OF DEFECTS IN INSB SINGLE CRYSTALS BY X-RAY TOPOGRAPHIC METHODS
OLKHOVIKOVA, TI
SHULPINA, IL
SOVIET PHYSICS SOLID STATE,USSR, 1969, 10 (07): : 1678 - +
[4] X-RAY TOPOGRAPHIC INVESTIGATION OF MICRODEFORMATION OF INSB SINGLE-CRYSTALS
SUROWIEC, MR
TANNER, BK
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1987, 55 (06): : 791 - 805
[5] X-RAY TOPOGRAPHIC STUDIES OF DISLOCATIONS IN IRON-SILICON ALLOY SINGLE CRYSTALS
LANG, AR
POLCAROVA, M
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1965, 285 (1401) : 297 - +
[6] EXTINCTION OF X-RAY TOPOGRAPHIC IMAGES OF COPPER PRECIPITATES IN SILICON SINGLE-CRYSTALS
CHIKAURA, Y
KISHIMOTO, K
JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (01) : L5 - L8
[7] X-RAY TOPOGRAPHIC STUDIES ON LATTICE DISTORTIONS OF SINGLE CRYSTALS OF SILICON DUE TO SCRATCHING
RENNINGE.M
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1972, 5 (JUN1) : 163 - &
[8] X-RAY TOPOGRAPHIC OBSERVATION OF MOVING DISLOCATIONS IN SILICON CRYSTALS
CHIKAWA, J
ABE, T
FUJIMOTO, I
APPLIED PHYSICS LETTERS, 1972, 21 (06) : 295 - &
[9] X-ray Interferometric Investigation of Strain Fields in Silicon Single Crystals
H. R. Drmeyan
Crystallography Reports, 2018, 63 : 1088 - 1091
[10] X-ray Interferometric Investigation of Strain Fields in Silicon Single Crystals
Drmeyan, H. R.
CRYSTALLOGRAPHY REPORTS, 2018, 63 (07) : 1088 - 1091

← 1 2 3 4 5 →