X-ray and γ-resonance optics for surface diagnostics

被引:0
|
作者
Semenov, V.G.
Irkaev, S.M.
Panchuk, V.V.
Cherneutsany, K.P.
机构
来源
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:499 / 503
相关论文
共 50 条
  • [31] X-ray fluorescence imaging with polycapillary X-ray optics
    Yonehara, Tasuku
    Yamaguchi, Makoto
    Tsuji, Kouichi
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2010, 65 (06) : 441 - 444
  • [32] Surface gradient integrated profiler for X-ray and EUV optics
    Higashi, Yasuo
    Takaie, Yuichi
    Endo, Katsuyoshi
    Kume, Tatsuya
    Enami, Kazuhiro
    Yamauchi, Kazuto
    Yamamura, Kazuya
    Sano, Yasuhisa
    Ueno, Kenji
    Mori, Yuzo
    SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS, 2007, 8 (03) : 177 - 180
  • [33] Multilayers for EUV, soft X-ray and X-ray optics
    Wang, Zhanshan
    Huang, Qiushi
    Zhang, Zhong
    TERAHERTZ, RF, MILLIMETER, AND SUBMILLIMETER-WAVE TECHNOLOGY AND APPLICATIONS IX, 2016, 9747
  • [34] PROBLEMS IN THE IMPLEMENTATION OF X-RAY OPTICS WITH X-RAY LASERS
    MACGOWAN, BJ
    MROWKA, S
    BARBEE, TW
    DASILVA, LB
    EDER, DC
    KOCH, JA
    UNDERWOOD, JH
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1992, (125): : 269 - 274
  • [35] X-RAY EUV OPTICS
    HOOVER, RB
    OPTICAL ENGINEERING, 1990, 29 (06) : 575 - 575
  • [36] X-ray quantum optics
    Adams, Bernhard W.
    Buth, Christian
    Cavaletto, Stefano M.
    Evers, Joerg
    Harman, Zoltan
    Keitel, Christoph H.
    Palffy, Adriana
    Picon, Antonio
    Roehlsberger, Ralf
    Rostovtsev, Yuri
    Tamasaku, Kenji
    JOURNAL OF MODERN OPTICS, 2013, 60 (01) : 2 - 21
  • [37] X-RAY EUV OPTICS
    HOOVER, RB
    OPTICAL ENGINEERING, 1991, 30 (08) : 1047 - 1048
  • [38] Chandra x-ray optics
    NASA, Marshall Space Flight Center, Huntsville AL 35812, United States
    Opt Eng, 2012, 1
  • [39] Multilayer X-ray optics
    Vinogradov, AV
    QUANTUM ELECTRONICS, 2002, 32 (12) : 1113 - 1121
  • [40] X-ray and Neutron Optics
    Cremer, Jay Theodore, Jr.
    ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 172: NEUTRON AND X-RAY MICROSCOPY, PT 1, 2012, 172 : 607 - 654