共 50 条
- [41] Self-aligned rapid thermal nitridation of TiSi2 in NH3 ambient as a diffusion barrier layer for selective CVD-Al contact plug formation Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 1995, 34 (2 B): : 992 - 996
- [42] SELF-ALIGNED RAPID THERMAL NITRIDATION OF TISI2 IN NH3 AMBIENT AS A DIFFUSION BARRIER LAYER FOR SELECTIVE CVD-AL CONTACT PLUG FORMATION JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (2B): : 992 - 996
- [45] MOS devices with high quality ultra thin CVD ZrO2 Gate dielectrics and self-aligned TaN and TaN/poly-Si gate electrodes 2001 SYMPOSIUM ON VLSI TECHNOLOGY, DIGEST OF TECHNICAL PAPERS, 2001, : 137 - 138
- [49] The effects of preoxidation by N2O plasma on the silicon dioxide as a gate insulator of poly-Si thin film transistor on a flexible substrate application IDW '06: PROCEEDINGS OF THE 13TH INTERNATIONAL DISPLAY WORKSHOPS, VOLS 1-3, 2006, : 743 - +