FORMATION OF A TiSi2/n + POLY-Si LAYER BY RAPID LAMP HEATING AND ITS APPLICATION TO MOS DEVICES.

被引:0
|
作者
Yachi, T. [1 ]
机构
[1] NTT, Musashino Electrical, Communication Lab, Tokyo, Jpn, NTT, Musashino Electrical Communication Lab, Tokyo, Jpn
来源
Electron device letters | 1984年 / EDL-5卷 / 07期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
11
引用
收藏
页码:217 / 220
相关论文
共 50 条
  • [21] MOS COMPATIBILITY OF HIGH-CONDUCTIVITY TASI2-N+ POLY-SI GATES
    SINHA, AK
    LINDENBERGER, WS
    FRASER, DB
    MURARKA, SP
    FULS, EN
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1980, 27 (08) : 1425 - 1430
  • [22] MOS COMPATIBILITY OF HIGH-CONDUCTIVITY TASI2-N+ POLY-SI GATES
    SINHA, AK
    LINDENBERGER, WS
    FRASER, DB
    MURARKA, SP
    FULS, EN
    IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1980, 15 (04) : 490 - 495
  • [23] Nickel silicide formation on Si(100) and poly-Si with a presilicide N2+ implantation
    Lee, PS
    Mangelinck, D
    Pey, KL
    Ding, J
    Chi, DZ
    Dai, JY
    See, A
    JOURNAL OF ELECTRONIC MATERIALS, 2001, 30 (12) : 1554 - 1559
  • [24] Nickel silicide formation on Si(100) and Poly-Si with a presilicide N2+ implantation
    P. S. Lee
    D. Mangelinck
    K. L. Pey
    J. Ding
    D. Z. Chi
    J. Y. Dai
    A. See
    Journal of Electronic Materials, 2001, 30 : 1554 - 1559
  • [25] FORMATION OF STABLE MOSI2/POLY-SI FILMS BY RAPID THERMAL ANNEALING
    PORTIUS, R
    DIETRICH, D
    HASSNER, A
    RASCHKE, T
    WIESER, E
    WOLKE, W
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1987, 100 (01): : 199 - 206
  • [26] SHALLOW, SILICIDED P+/N JUNCTION FORMATION AND DOPANT DIFFUSION IN SIO2/TISI2/SI STRUCTURE
    KU, YH
    LEE, SK
    KWONG, DL
    CHU, P
    APPLIED PHYSICS LETTERS, 1989, 54 (17) : 1684 - 1686
  • [27] High quality HfO2 film and its applications in novel Poly-Si devices
    Ng, KL
    Zhan, N
    Poon, MC
    Kok, CW
    Chan, M
    Wong, H
    SILICON MATERIALS-PROCESSING, CHARACTERIZATION AND RELIABILITY, 2002, 716 : 91 - 96
  • [28] Formation of C54–TiSi2 in titanium on nitrogen-ion-implanted (001)Si with a thin interposing Mo layer
    S. L. Cheng
    J. J. Jou
    L. J. Chen
    B. Y. Tsui
    Journal of Materials Research, 1999, 14 : 2061 - 2069
  • [29] Thin film poly-Si formation by Cat-CVD method and its application for solar cells
    Niira, K
    Senta, H
    Hakuma, H
    Komoda, M
    Okui, H
    Fukui, K
    Arimune, H
    Shirasawa, K
    THIN SOLID FILMS, 2001, 395 (1-2) : 315 - 319