German companies are being burdened by the high cost of high-tech

被引:0
|
作者
机构
来源
Water Serv | / 1196卷 / 28期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] CORPORATE CULTURE AND MARKET ORIENTATION IN HIGH-TECH COMPANIES
    Chalupsky, Vladimir
    SGEM 2016, BK 2: POLITICAL SCIENCES, LAW, FINANCE, ECONOMICS AND TOURISM CONFERENCE PROCEEDINGS, VOL V, 2016, : 169 - 176
  • [22] Increasing probability of a success for high-tech startup companies
    Bryzek, J
    TRANSDUCERS '01: EUROSENSORS XV, DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2, 2001, : 1268 - 1275
  • [23] Research on Labor Relations Issues of High-Tech Companies
    Wang Junling
    PROCEEDINGS OF 2014 INTERNATIONAL SYMPOSIUM - INTERNATIONAL MARKETING SCIENCE AND INFORMATION TECHNOLOGY, 2014, : 180 - 184
  • [24] Human Capital and Technological Innovation in High-tech Companies
    Zhao Hengping
    Lin Jinfeng
    PROCEEDINGS OF THE 3RD INTERNATIONAL CONFERENCE ON PRODUCT INNOVATION MANAGEMENT, VOLS I AND II, 2008, : 150 - 154
  • [25] Multidimensional Analysis of High-Tech Companies' Growth Potential
    Dragunova, Evgeniia V.
    2016 13TH INTERNATIONAL SCIENTIFIC-TECHNICAL CONFERENCE ON ACTUAL PROBLEMS OF ELECTRONIC INSTRUMENT ENGINEERING (APEIE), VOL 3, 2016, : 232 - 237
  • [26] Management of High-Tech Companies in Conditions of Import Substitution
    Pyatovsky, S.E.
    Efimova, N.S.
    Surkova, E.V.
    Russian Engineering Research, 2024, 44 (07) : 1050 - 1053
  • [27] MARKET ORIENTATION AND STRATEGIC BEHAVIOUR AT HIGH-TECH COMPANIES
    Kanovska, Lucie
    Tomaskova, Eva
    E & M EKONOMIE A MANAGEMENT, 2014, 17 (04): : 86 - 100
  • [28] Editorial: human resource management in high-tech companies
    Jolly, DR
    INTERNATIONAL JOURNAL OF TECHNOLOGY MANAGEMENT, 2005, 31 (3-4) : 197 - 203
  • [29] High-tech companies' readiness assessment for alternative workplaces
    Kim, Jun Ha
    Juan, Yi-Kai
    AFRICAN JOURNAL OF BUSINESS MANAGEMENT, 2011, 5 (28): : 11476 - 11486
  • [30] High-Tech Companies Are Low-Grade Investments
    Anderson, Mark
    IEEE SPECTRUM, 2010, 47 (11) : 84 - 84