New test method for contactless quantitative current measurement via scanning magneto-resistive probe microscopy

被引：0
作者：
Bae, S. [1 ]
Schlensog, A. [1 ]
Mertin, W. [1 ]
Kubalek, E. [1 ]
Maywald, M. [1 ]
机构：
[1] Gerhard-Mercator-Universitaet, Duisburg, Duisburg, Germany
来源：
Microelectronics Reliability | 1998年 / 38卷 / 6-8期
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页码：969 / 974
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