High-bandwidth force and impedance control for industrial robots

被引:0
|
作者
Freund, Eckhard [1 ]
Pesara, Juergen [1 ]
机构
[1] Univ of Dortmund, Dortmund, Germany
来源
Robotica | 1998年 / 16卷 / pt 1期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:75 / 87
相关论文
共 50 条
  • [41] Tapping-mode force spectroscopy using cantilevers with interferometric high-bandwidth force sensors
    Sarioglu, A. Fatih
    Magonov, Sergei
    Solgaard, Olav
    APPLIED PHYSICS LETTERS, 2012, 100 (05)
  • [42] High-bandwidth nanopositioning via active control of system resonance
    Li, Linlin
    Aphale, Sumeet S.
    Zhu, Limin
    FRONTIERS OF MECHANICAL ENGINEERING, 2021, 16 (02) : 331 - 339
  • [43] High-bandwidth NMR teslameter
    Taylor, J.
    Mouton, H. du T.
    Jones, T.
    2007 AFRICON, VOLS 1-3, 2007, : 245 - 250
  • [44] High-bandwidth nanopositioning via active control of system resonance
    Linlin LI
    Sumeet SAPHALE
    Limin ZHU
    Frontiers of Mechanical Engineering, 2021, (02) : 331 - 339
  • [45] High-bandwidth polymer modulators
    Chen, DT
    Fetterman, HR
    Chen, AT
    Steier, WH
    Dalton, LR
    Wang, WS
    Shi, YQ
    OPTOELECTRONIC INTEGRATED CIRCUITS, 1997, 3006 : 314 - 317
  • [46] High-bandwidth VCSEL devices
    Paraskevopoulos, A.
    2006 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2, 2006, : 400 - +
  • [47] High-Bandwidth Contact State Estimation with only Joint Angle Feedback for Legged Robots
    Yang, Junjie
    Sun, Hao
    Jia, Yinghao
    Wang, Changhong
    JOURNAL OF INTELLIGENT & ROBOTIC SYSTEMS, 2025, 111 (01)
  • [48] Fast Stiffness Mapping of Cells Using High-Bandwidth Atomic Force Microscopy
    Wang, Andrew
    Vijayraghavan, Karthik
    Solgaard, Olav
    Butte, Manish J.
    ACS NANO, 2016, 10 (01) : 257 - 264
  • [49] High-bandwidth multimode self-sensing in bimodal atomic force microscopy
    Ruppert, Michael G.
    Moheimani, S. O. Reza
    BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2016, 7 : 284 - 295
  • [50] Design and Control of a Multi-actuated High-bandwidth and Large-range Scanner for Atomic Force Microscopy
    Xia, F.
    Truncale, S.
    Wang, Y.
    Youcef-Toumi, K.
    2018 ANNUAL AMERICAN CONTROL CONFERENCE (ACC), 2018, : 4330 - 4335