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- [3] X-RAY PHOTO-ELECTRON SPECTROSCOPY AND SECONDARY ION MASS-SPECTROMETRY STUDIES OF INITIAL-STAGES OF ZR OXIDATION FIZIKA TVERDOGO TELA, 1982, 24 (09): : 2816 - 2818
- [4] SURFACE AND BULK STUDIES OF HORNBLENDE USING SECONDARY ION MASS-SPECTROMETRY (SIMS), AUGER-ELECTRON SPECTROSCOPY (AES), AND X-RAY PHOTO-ELECTRON SPECTROSCOPY (XPS) ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1981, 182 (AUG): : 19 - GEOC
- [6] EFFECT OF X-RAY FLUX ON POLYTETRAFLUOROETHYLENE IN X-RAY PHOTO-ELECTRON SPECTROSCOPY JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (02): : 226 - 232