Combination of positron annihilation and scanning tunneling microscopy: A unique approach to characterize defects

被引：0
作者：
Gebauer, J. [1 ]
Krause-Rehberg, R. [1 ]
Domke, C. [1 ]
Ebert, Ph. [1 ]
Urbar, K. [1 ]
机构：
[1] Martin-Luther-Universitaet, Halle-Wittenberg, Halle, Germany
来源：
Materials Science Forum | 1997年 / 255-257卷
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页码：494 / 496
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