Combination of positron annihilation and scanning tunneling microscopy: A unique approach to characterize defects

被引：0

作者：

Gebauer, J. ^{[1
]}

Krause-Rehberg, R. ^{[1
]}

Domke, C. ^{[1
]}

Ebert, Ph. ^{[1
]}

Urbar, K. ^{[1
]}

机构：

[1] Martin-Luther-Universitaet, Halle-Wittenberg, Halle, Germany

来源：

Materials Science Forum | 1997年 / 255-257卷

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：494 / 496

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