Mapping of sp2/sp3 in DLC thin film by signal processed ESI series energy-loss image

被引：0

作者：

Department of Engineering and System Science, National Tsing-Hua University, HsinChu ^{[1
]}

300, Taiwan

机构：

来源：

Microsc. | 2050年 / 6卷 / 391-400期

关键词：

Compendex;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Electron energy levels - Electron energy loss spectroscopy - Electron scattering - Electronic structure - Energy dissipation - Fourier series - Image processing - Interpolation - Maximum entropy methods - Thin films - Wavelet transforms

引用