Conventional Transmission-Electron-Microscopy Techniques in Convergent-Beam Electron Diffraction

被引：0
|
作者：
Tanaka, Michiyoshi [1 ]
机构：
[1] Department of Physics, Faculty of Science, Tohoku University, Sendai,980, Japan
来源：
| 1600年 / Oxford University Press卷 / 35期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Electron diffraction
引用
收藏
相关论文
共 50 条
  • [41] SUPPRESSION OF CONTAMINATION IN CONVERGENT-BEAM ELECTRON-DIFFRACTION CAMERA
    DOWELL, WCT
    GOODMAN, P
    ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1977, 32 (11): : 1326 - 1327
  • [42] REFINEMENT OF CRYSTAL STRUCTURAL PARAMETERS BY CONVERGENT-BEAM ELECTRON DIFFRACTION
    Tsuda, K.
    Tanaka, M.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1999, 55 : 147 - 147
  • [43] AN INVESTIGATION OF A METASTABLE FORM OF GAS BY CONVERGENT-BEAM ELECTRON-DIFFRACTION AND HIGH-RESOLUTION ELECTRON-MICROSCOPY
    GOODMAN, P
    OLSEN, A
    WHITFIELD, HJ
    ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1985, 41 (OCT): : 292 - 298
  • [44] TECHNIQUES OF CONVERGENT BEAM ELECTRON-DIFFRACTION
    VINCENT, R
    JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1989, 13 (01): : 40 - 50
  • [45] Determination of the electrostatic potential and electron density of silicon using convergent-beam electron diffraction
    Ogata, Yoichiro
    Tsuda, Kenji
    Tanaka, Michiyoshi
    ACTA CRYSTALLOGRAPHICA SECTION A, 2008, 64 : 587 - 597
  • [46] Three-beam convergent-beam electron diffraction for measuring crystallographic phases
    Guo, Yueming
    Nakashima, Philip N. H.
    Etheridge, Joanne
    IUCRJ, 2018, 5 : 753 - 764
  • [47] IDENTIFICATION OF LATTICE-DEFECTS BY CONVERGENT-BEAM ELECTRON-DIFFRACTION
    TANAKA, M
    TERAUCHI, M
    KANEYAMA, T
    JOURNAL OF ELECTRON MICROSCOPY, 1991, 40 (04): : 211 - 220
  • [48] COHERENT INTERFERENCE IN CONVERGENT-BEAM ELECTRON-DIFFRACTION AND SHADOW IMAGING
    COWLEY, JM
    ULTRAMICROSCOPY, 1979, 4 (04) : 435 - 450
  • [49] CONVERGENT-BEAM ELECTRON-DIFFRACTION FROM GAAS/ALAS SUPERLATTICES
    GAT, R
    SCHAPINK, FW
    ULTRAMICROSCOPY, 1987, 21 (04) : 389 - 392
  • [50] CONVERGENT-BEAM ELECTRON-DIFFRACTION FROM GAAS/ALAS MULTILAYERS
    PENNOCK, GM
    SCHAPINK, FW
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1987, (87): : 219 - 224
12345