OBSERVATION OF DEFECT STRUCTURES IN InAsxP1 - x SINGLE CRYSTALS BY SYNCHROTRON X-RADIATION LAUE TOPOGRAPHY.

被引:0
|
作者
Minato, Ichiro [1 ]
Sakata, Osami [1 ]
Fukano, Tatsuo [1 ]
Hashizume, Hiroo [1 ]
Kitano, Tomohisa [1 ]
Watanabe, Hisao [1 ]
Kamejima, Taibun [1 ]
Matsui, Junji [1 ]
机构
[1] Tokyo Inst of Technology, Research, Lab of Engineering Materials,, Yokohama, Jpn, Tokyo Inst of Technology, Research Lab of Engineering Materials, Yokohama, Jpn
关键词
HETEROJUNCTIONS - LATTICE DEFECTS - LAUE TOPOGRAPHY - X-RAY DIFFRACTION TOPOGRAPHY;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:37 / 44
相关论文
共 50 条
  • [1] SYNCHROTRON X-RADIATION TOPOGRAPHY
    TANNER, BK
    BOWEN, DK
    MATERIALS SCIENCE REPORTS, 1992, 8 (08): : 369 - 407
  • [2] IN SITU OBSERVATION OF SOLIDIFICATION OF SILICON STEEL BY SYNCHROTRON RADIATION X-RAY TOPOGRAPHY.
    Matsumiya, Tooru
    Yamada, Wataru
    Ohashi, Tetsuro
    Nittono, Osamu
    Metallurgical transactions. A, Physical metallurgy and materials science, 1987, 18 A (05): : 723 - 727
  • [3] Observation of surface acoustic waves using synchrotron radiation X-ray topography.
    Capelle, Bernard
    Epelboin, Yves
    Soyer, Alain
    Detaint, Jacques
    2012 IEEE INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM (FCS), 2012,
  • [4] DOUBLE LAUE PATTERN TOPOGRAPHY OF TOP-SEEDED BATIO3 SINGLE-CRYSTALS USING WHITE SYNCHROTRON X-RADIATION
    STEPHENSON, JD
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1984, 84 (01): : 19 - 30
  • [5] THE RECORDING AND ANALYSIS OF SYNCHROTRON X-RADIATION LAUE DIFFRACTION PHOTOGRAPHS
    HELLIWELL, JR
    HABASH, J
    CRUICKSHANK, DWJ
    HARDING, MM
    GREENHOUGH, TJ
    CAMPBELL, JW
    CLIFTON, IJ
    ELDER, M
    MACHIN, PA
    PAPIZ, MZ
    ZUREK, S
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1989, 22 : 483 - 497
  • [6] OBSERVATION OF MICRODEFECTS IN THIN SILICON-CRYSTALS BY MEANS OF PLANE-WAVE TOPOGRAPHY USING SYNCHROTRON X-RADIATION
    CHIKAURA, Y
    IMAI, M
    ISHIKAWA, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1987, 26 (06): : L889 - L892
  • [7] SAGITTAL FOCUSING OF SYNCHROTRON X-RADIATION WITH CURVED CRYSTALS
    SPARKS, CJ
    ICE, GE
    WONG, J
    BATTERMAN, BW
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 195 (1-2): : 73 - 78
  • [8] A STUDY OF THE DEFECT STRUCTURES IN CDTE CRYSTALS USING SYNCHROTRON X-RAY TOPOGRAPHY
    LU, YC
    FEIGELSON, RS
    ROUTE, RK
    REK, ZU
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (04): : 2190 - 2194
  • [9] METHOD OF FABRICATING RIBBED CRYSTALS FOR FOCUSING SYNCHROTRON X-RADIATION
    WONG, J
    STELLA, EG
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1984, 224 (1-2): : 308 - 309
  • [10] SYNCHROTRON X-RADIATION PLANE-WAVE TOPOGRAPHY FOR IMAGING MICRODEFECTS IN THINNED SILICON-CRYSTALS
    CHIKAURA, Y
    IMAI, M
    SUZUKI, Y
    YATSURUGI, Y
    JOURNAL OF CRYSTAL GROWTH, 1990, 103 (1-4) : 141 - 149